HLK test item's test configuration

Question

HLK test item's test configuration

m_none 1

Hi Microsoft Community,

Among the HLK Test items below, are there any test items that require different test configurations for USB3 driver and PCI Express driver?
-. DF-Concurrent Hardware And Operation System(CHAOS) Test (Development and integration)
-. DF-Concurrent Hardware And Operation System(CHAOS) Test (Reliability)
-. DF-Sleep and PNP (disable and enable) with IO Before and After (Development and integration)
-. DF-Sleep and PNP (disable and enable) with IO Before and After (Reliability)
-. DF-Sleep with IO Before and After (Bring up)
-. DF-Sleep with IO During (Development and integration)
-. DF-Sleep with IO During (Reliability)

The driver for USB3 under development is pass, but the driver for PCI Express has failed. I am wondering if there are any test setting errors other than driver errors.

Pavel A 431 Reputation points

2021-10-02T06:09:35.99+00:00

Would you like to share at least some detail on what failed? Is the PCIe device based on your own FPGA or ASIC?
m_none 1 Reputation point

2021-10-04T02:14:37.217+00:00
The analysis in WinDbg is as follows.

DRIVER_IRQL_NOT_LESS_OR_EQUAL (d1) An attempt was made to access a pageable (or completely invalid) address at

` an interrupt request level (IRQL) that is too high. This is usually
caused by drivers using improper addresses.
If kernel debugger is available get stack backtrace.
Arguments:
Arg1: fffff802596804d0, memory referenced
Arg2: 0000000000000002, IRQL
Arg3: 0000000000000008, value 0 = read operation, 1 = write operation
Arg4: fffff802596804d0, address which referenced memory

We used Xilinx FPGA.