Test Kits in the CETK (Windows Embedded CE 6.0)
1/6/2010
The Windows Embedded CE 6.0 Test Kit (CETK) provides multiple test kits. Each one provides a combination of CETK tests. Some CETK tests appear in multiple test kits, and some have a different command line in each test kit. A test kit tests a specific category of Windows Embedded CE–based devices.
The name of the test kit indicates the category of target devices that the test kit tests: for example, generic Windows Embedded CE–based devices.
For each target device that you connect to the CETK, you can choose the test kit to make active for the target device. The active test kit is the test kit that contains the tests that you want to run on that target device. For information about choosing a test kit to make active, see Choosing the Active Test Kit for a Target Device Connected to the CETK.
For each target device connected to the CETK, only one test kit can be active at a time. In the tree view of the CETK window, you can expand the node for the active test kit only. On a target device, you can run CETK tests only for the active test kit.