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OAL Timer Tests (Windows Embedded CE 6.0)

1/6/2010

The OAL Timer Tests confirm that the timers in a board support package (BSP) and OEM adaptation layer (OAL) operate correctly. Three different timers are tested: the GetTickCount (GTC) clock, the high-performance clock, and the real-time clock (RTC). This test verifies that the resolution and drift of each timer are within acceptable bounds and that no timer runs backward (monotonically increases until overflow). Drift tests compare the timers to each other. The RTC to NTP Drift Test compares the RTC with an NTP server, if available.

To compare the timers on the target device to outside clock sources, you can make use of the wall clock drift tests. These semi-automated tests verify that the onboard timers do not drift relative to outside clocks. The wall clock drift tests are not currently documented outside the CETK database.

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OAL Tests

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CETK Tests