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Logged Information for the Windows Embedded CE Stress Tool (Windows Embedded CE 6.0)

  • Article

1/6/2010

The Windows Embedded CE Stress tool records test results, system information, and stress test parameters in an XML log file on the development workstation. The Windows Embedded CE Stress tool updates this information for the duration of the stress test. For information about the location of the .xml log file, see Options for the Windows Embedded CE Stress Tool.

You can view the .xml log file in one of these ways:

  • By choosing the appropriate button in the Results panel of the dialog box for the Windows Embedded CE Stress tool.
  • By opening the Stresslog.htm file from <Platform Builder installation path>\cepb\wcetk\ddtk\Desktop, and then navigating to the .xml file for the stress test you want to investigate.

The harness overwrites an existing log file for a target device each time you start a new stress test. To save a previous .xml log file, copy the file to a different location before starting a new stress test on the target device.

The following table shows information contained in an .xml log file.

Log file contents Description

Test Results

Displays the results of the individual test cases for each test module. All results are cumulative.

Environment

Displays the parameters used to run the Windows Embedded CE Stress tool and system information for the target device.

System Info

Displays the following information:

  • Memory use for test modules, including maximum expected memory use
  • Memory use for all processes that run during the stress test
  • Memory use history for system processes
  • Network interface and protocol information, if the target device has network interfaces.

Log

Displays the harness log. This log contains information that pertains to the operation of the harness. You can use this log to diagnose problems with setup of the Windows Embedded CE Stress tool.

See Also

Other Resources

Windows Embedded CE Stress Tool