Device.Fundamentals Reliability Tests
The following tests are included in the Device.Fundamentals Reliability category:
DF - Concurrent Hardware And Operating System (CHAOS) Test (Certification)
DF - Concurrent Hardware And Operating System (CHAOS) Test (Reliability)
DF - Fuzz misc API with zero length query test (Certification)
DF - Fuzz Query and Set File Information Test (Certification)
DF - PCI Root Port Surprise Remove Test (PCI devices only) (Certification)
DF - PNP (disable and enable) with IO Before and After (Basic)
DF - PNP Rebalance Request New Resources Device Test (Certification)
DF - PNP Rebalance Request New Resources Device Test (Functional)
DF - SimpleIO stress test with IO process termination (Functional)
DF - Sleep and PNP (disable and enable) with IO Before and After (Certification)
DF - Sleep and PNP (disable and enable) with IO Before and After (Functional)
Systematic Fault Injection - PNP (disable and enable) with IO Before and After
Related topics
Device.Fundamentals Reliability Testing